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A new approach to process gamma scattering spectra for aluminum materials

Nguyen Hoang Vo 1, *
Thanh Thien Tran 1
Bao Huu Nguyen 1
Thanh Nguyen The Cao 1
Tao Van Chau 1
  1. University of Science, VNU-HCM
Correspondence to: Nguyen Hoang Vo, University of Science, VNU-HCM. Email: pvphuc@vnuhcm.edu.vn.
Volume & Issue: Vol. 2 No. 4 (2018) | Page No.: 82-87 | DOI: 10.32508/stdjns.v2i4.814
Published: 2019-08-13

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This article is published with open access by Viet Nam National University Ho Chi Minh City, Viet Nam. This article is distributed under the terms of the Creative Commons Attribution License (CC-BY 4.0) which permits any use, distribution, and reproduction in any medium, provided the original author(s) and the source are credited.

Abstract

In this study, we used Monte Carlo method to simulate each separate component of the gamma scattering spectrum. The gamma rays emitted from a 137Cs source, scatter on aluminum targets and recorded by a NaI(Tl) detector. Based on the distribution characteristics of each scattering component, we propose a new method to analyze scattered gamma spectra. This method was applied for simulated spectra to estimate the material thickness gives good results.

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